<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>47</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Schroter, Adrian</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Predicting Defects and Changes with Import Relations</style></title><secondary-title><style face="normal" font="default" size="100%">Fourth International Workshop on Mining Software Repositories (MSR'07:ICSE Workshops 2007)</style></secondary-title></titles><keywords><keyword><style  face="normal" font="default" size="100%">defects</style></keyword><keyword><style  face="normal" font="default" size="100%">eclipse</style></keyword><keyword><style  face="normal" font="default" size="100%">effort estimation</style></keyword><keyword><style  face="normal" font="default" size="100%">mining challenge</style></keyword><keyword><style  face="normal" font="default" size="100%">msr challenge</style></keyword><keyword><style  face="normal" font="default" size="100%">prediction</style></keyword></keywords><dates><year><style  face="normal" font="default" size="100%">2007</style></year></dates><urls><related-urls><url><style face="normal" font="default" size="100%">http://ifipwg213.org/sites/flosshub.org/files/28300031.pdf</style></url></related-urls></urls><publisher><style face="normal" font="default" size="100%">IEEE</style></publisher><pub-location><style face="normal" font="default" size="100%">Minneapolis, MN, USA</style></pub-location><pages><style face="normal" font="default" size="100%">31 - 31</style></pages><isbn><style face="normal" font="default" size="100%">0-7695-2950-X</style></isbn><abstract><style face="normal" font="default" size="100%">Lowering the number of defects and estimating the development time of a software project are two important goals of software engineering. To predict the number of defects and changes we train models with import relations. This enables us to decrease the number of defects by more efficient testing and to assess the effort needed in respect to the number of changes.</style></abstract></record></records></xml>